PSI VUV About Database

Valence TPES 8.29-19 eV

Citation 10.1021/acs.jpca.1c00876
Type Threshold photoelectron spectrum
Further references 10.1063/1.4984304
10.1016/j.nima.2009.08.069
T / K 298
Source effusive
Resolution / meV 5
Flux normalization no
Comments 600 lines/mm grating; 216 V/cm extraction field, sample was placed directly in the ionization chamber in a small beaker
Date & facility 2019-03, SLS/VUV
Date entered 2022-12-09
XW, AB

Ground-state FC simulation for conformer (I)

Citation 10.1021/acs.jpca.1c00876
Type Franck-Condon simulation
Further references Gaussian 16 A.03
T / K 298
Level of theory B3LYP/6-311++G(d,p)
Convolution FWHM / meV 45
0-0 transition / eV 8.3
Date & facility 2019, SLS/VUV
Date entered 2022-12-09
XW, AB

Ground-state FC simulation for conformer (II)

Citation 10.1021/acs.jpca.1c00876
Type Franck-Condon simulation
Further references Gaussian 16 A.03
T / K 298
Level of theory B3LYP/6-311++G(d,p)
Convolution FWHM / meV 45
0-0 transition / eV 8.25
Date & facility 2019, SLS/VUV
Date entered 2022-12-09
XW, AB

Valence m/z 152 ms-TPES 8.29-12.4 eV

Citation 10.1021/acs.jpca.1c00876
Type Mass-selected threshold photoelectron spectrum
Further references 10.1063/1.4984304
10.1016/j.nima.2009.08.069
T / K 298
Source effusive
Resolution / meV 5
Flux normalization no
Comments 600 lines/mm grating; 216 V/cm extraction field, sample was placed directly in the ionization chamber in a small beaker
Date & facility 2019-03, SLS/VUV
Date entered 2023-03-23
XW, AB